Nikawa, Kiyoshi : rechercher sur Z-Library

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1

VLSI failure analysis: A review

Journal:

Microelectronics Reliability

Année:

1992

Langue:

english

Fichier:

PDF, 1.44 MB

english, 1992

2

Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique

Goto, Yasunori, Matsumoto, Toru, Nikawa, Kiyoshi

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 3.20 MB

english, 2013

3

Laser THz emission microscope as a novel tool for LSI failure analysis

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa

Journal:

Microelectronics Reliability

Année:

2009

Langue:

english

Fichier:

PDF, 2.53 MB

english, 2009

4

LSI failure analysis using focused laser beam heating

Kiyoshi Nikawa, Shoji Inoue

Journal:

Microelectronics Reliability

Année:

1997

Langue:

english

Fichier:

PDF, 537 KB

english, 1997

5

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

Journal:

Microelectronics Reliability

Année:

2011

Langue:

english

Fichier:

PDF, 1.57 MB

english, 2011

6

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Non-electrical-contact LSI failure analysis using non-bias laser terahertz emission microscope

Nikawa, Kiyoshi, Yamashita, Masatsugu, Matsumoto, Toru, Otani, Chiko, Tonouchi, Masayoshi, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji

Année:

2011

Langue:

english

Fichier:

PDF, 2.41 MB

english, 2011

7

Synergistic effects of FGF-2 and Activin A on early neural differentiation of human pluripotent stem cells

Mimura, Sumiyo, Suga, Mika, Liu, Yujung, Kinehara, Masaki, Yanagihara, Kana, Ohnuma, Kiyoshi, Nikawa, Hiroki, Furue, Miho K.

Journal:

In Vitro Cellular & Developmental Biology - Animal

Année:

2015

Langue:

english

Fichier:

PDF, 4.52 MB

english, 2015

8

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis

NIKAWA, Kiyoshi, INOUE, Shouji, NAGAISHI, Tatsuoki, MATSUMOTO, Toru, MIURA, Katsuyoshi, NAKAMAE, Koji

Journal:

IEICE Transactions on Electronics

Année:

2009

Langue:

english

Fichier:

PDF, 1.47 MB

english, 2009

9

Present State of Development of Laser-Assisted Wide Angle Three-Dimensional Atom Probe

Norihito Mayama, Tatsuo Iwata, Chikanori Yamashita, Satoko Ito, Tetsuya Kaneko, Sunao Mikami, Yuya Hanaoka, Yasuko Kajiwara, Takashi Kaito, Tatsuya Adachi, Hitoshi Hoshino, Kiyoshi Nikawa, Masashi Noj

Journal:

Surface and Interface Analysis

Année:

2010

Langue:

english

Fichier:

PDF, 640 KB

english, 2010

10

THz emission characteristics from p/n junctions with metal lines under non-bias conditions for LSI failure analysis

Yamashita, Masatsugu, Otani, Chiko, Matsumoto, Toru, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Nikawa, Kiyoshi, Kim, Sunmi, Murakami, Hironaru, Tonouchi, Masayoshi

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.44 MB

english, 2011

11

Impaired Vitamin A-Mediated Mucosal IgA Response in IL-5 Receptor-Knockout Mice

Takeshi Nikawa, Madoka Ikemoto, Mihoko Kano, Kaori Tokuoka, Katsuya Hirasaka, Shoji Uehara, Kiyoshi Takatsu, Kazuhito Rokutan, Kyoichi Kishi

Journal:

Biochemical and Biophysical Research Communications

Année:

2001

Langue:

english

Fichier:

PDF, 79 KB

english, 2001

12

Novel Method for Defect Detection in Al Stripes by Means of Laser Beam Heating and Detection of Changes in Electrical Resistance

Nikawa, Kiyoshi, Matsumoto, Chika, Inoue, Shoji

Journal:

Japanese Journal of Applied Physics

Année:

1995

Fichier:

PDF, 1.60 MB

1995

13

[IEEE 17th International Reliability Physics Symposium - San Diego, CA, USA (1979.04.24-1979.04.26)] 17th International Reliability Physics Symposium - Electromigration of Sputtered Al-Si Alloy Films

Nagasawa, Eiji, Okabayashi, Hidekazu, Nozaki, Tadatoshi, Nikawa, Kiyoshi

Année:

1979

Langue:

english

Fichier:

PDF, 7.11 MB

english, 1979

14

Backside observation of large-scale integrated circuits with multilayered interconnections using laser terahertz emission microscope

Yamashita, Masatsugu, Otani, Chiko, Kawase, Kodo, Matsumoto, Toru, Nikawa, Kiyoshi, Kim, Sunmi, Murakami, Hironaru, Tonouchi, Masayoshi

Journal:

Applied Physics Letters

Année:

2009

Langue:

english

Fichier:

PDF, 679 KB

english, 2009

15

[IEEE 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves (IRMMW-THz 2008) - Pasadena, CA (2008.09.15-2008.09.19)] 2008 33rd International Conference on Infrared, Millimeter and Terahertz Waves - Observation of semiconductor test circuits after building-in defect using laser THz emission microscope

Yamashita, Masatsugu, Chiko Otani,, Toru Matsumoto,, Katsuyoshi Miura,, Koji Nakamae,, Masayoshi Tonouchi,, Kiyoshi Nikawa,

Année:

2008

Langue:

english

Fichier:

PDF, 431 KB

english, 2008

16

Noncontact inspection technique for electrical failures in semiconductor devices using a laser terahertz emission microscope

Yamashita, Masatsugu, Otani, Chiko, Kawase, Kodo, Nikawa, Kiyoshi, Tonouchi, Masayoshi

Journal:

Applied Physics Letters

Année:

2008

Langue:

english

Fichier:

PDF, 576 KB

english, 2008

17

[IEEE 19th International Reliability Physics Symposium - Las Vegas, NV, USA (1981.04.7-1981.04.9)] 19th International Reliability Physics Symposium - Monte Carlo Calculations Based on the Generalized Electromigration Failure Model

Nikawa, Kiyoshi

Année:

1981

Langue:

english

Fichier:

PDF, 6.77 MB

english, 1981

18

[IEEE 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves (IORMMW-THz 2009) - Busan, South Korea (2009.09.21-2009.09.25)] 2009 34th International Conference on Infrared, Millimeter, and Terahertz Waves - Development of an LTEM prototype system for LSI failure analysis

Yamashita, Masatsugu, Otani, Chiko, Sunmi, Kim, Murakmai, Hironaru, Tonouchi, Masayoshi, Matsumoto, Toru, Midoh, Yoshihiro, Miura, Katsuyoshi, Nakamae, Koji, Nikawa, Kiyoshi

Année:

2009

Langue:

english

Fichier:

PDF, 711 KB

english, 2009

19

Molecular Dynamics Simulation of Electromigration in Nano-sized Metal Lines

Ohkubo, Tadakatsu, Hirotsu, Yoshihiko, Nikawa, Kiyoshi

Journal:

Materials Transactions, JIM

Année:

1996

Fichier:

PDF, 809 KB

1996

20

Recent Topics in High- T c Superconductive Electronics

Tonouchi, Masayoshi, Fujimaki, Akira, Tanabe, Keiichi, Enpuku, Keiji, Nikawa, Kiyoshi, Kobayashi, Takeshi

Journal:

Japanese Journal of Applied Physics

Année:

2005

Langue:

english

Fichier:

PDF, 960 KB

english, 2005

21

Altered KYN/TRP, Gln/Glu, and Met/methionine sulfoxide ratios in the blood plasma of medication-free patients with major depressive disorder

Umehara, Hidehiro, Numata, Shusuke, Watanabe, Shin-ya, Hatakeyama, Yutaka, Kinoshita, Makoto, Tomioka, Yukiko, Nakahara, Kiyoshi, Nikawa, Takeshi, Ohmori, Tetsuro

Journal:

Scientific Reports

Année:

2017

Langue:

english

Fichier:

PDF, 1.12 MB

english, 2017

22

LSI Failure Analysis Using Laser Terahertz Emission Microscope

YAMASHITA, Masatsugu, OTANI, Chiko, MATSUMOTO, Toru, GOTO, Yasunori, TONOUCHI, Masayoshi, NAKAMAE, Koji, NIKAWA, Kiyoshi

Journal:

Journal of the Japan Society for Precision Engineering

Année:

2016

Fichier:

PDF, 1.67 MB

2016

23

[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Molecular dynamics simulation of electromigration under electric field

Ohkubo, Tadakatsu, Hirotsu, Yoshihiko, Nikawa, Kiyoshi

Année:

1998

Langue:

english

Fichier:

PDF, 1.11 MB

english, 1998

24

[AIP Third international stress workshop on stress-induced phenomena in metallization - Palo Alto, California (USA) (21-23 Jun 1995)] AIP Conference Proceedings - Void, Si nodule and current observations by optical beam heating and current change measurement

Nikawa, Kiyoshi, Inoue, Shoji

Année:

1996

Langue:

english

Fichier:

PDF, 1.01 MB

english, 1996

25

[AIP Third international stress workshop on stress-induced phenomena in metallization - Palo Alto, California (USA) (21-23 Jun 1995)] AIP Conference Proceedings - Void, Si nodule and current observations by optical beam heating and current change measurement

Nikawa, Kiyoshi, Inoue, Shoji

Année:

1996

Fichier:

PDF, 1.01 MB

1996